BK Precision 560 Test Set
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Model:
560
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Omschrijving:
Programmable IC Tester
Informatie
INTRODUCTION
The B & K-Precision model 560 Programmable IC Tester allows
personnel of varied skill levels to perform fast,
uncomplicated, and versatile IC testing. The powerful
microcomputer-based operating system of the model 560 allows
efficiency in IC testing not previously possible with
moderately-priced testers. The instrument tests over 90% of
the most popular digital ICs (including many RAM and ROM
ICs), due to an extensive internal library of IC test data.
To set up IC tests, you merely enter the desired testing
mode, the IC generic number, and press the TEST key. The
tester automatically arranges IC pin-out and test voltage
levels.
The tester also has provisions for in-circuit IC testing.
This is feasible via a special feature that applies current
backdrive to the in-circuit IC's surrounding circuitry,
allowing implementation of the tester truth table in most cases.
In addition to standard IC tests, the instrument also tests
ICs contained on board assemblies where inputs of a device
may be tied to logic states. Compare testing allows testing
where pins may be tied to Vcc or ground; a condition that
would cause "good" ICs to test "defective" with standard
testing. The tester records (stores) the unique response of
a reference IC and its circuit, and then uses this response
for testing similar untested ICs. This feature is offered in
both single-device (Device Compare) and multiple-device
(Board Learn) modes. Using the Board Learn mode allows you
to record the responses of all digital ICs contained on a
board in one continuous operation. This mode also allows
user indexing of IC and board nomenclature, thereby
maintaining a convenient record of board contents for future
use.
Direct, "no guesswork" IC test results are shown on the
fluorescent alphanumeric display which reads "PASS", or
"FAIL", showing which pin(s) tested defective. Using clear,
informative directives (via the display and LED arrays), the
tester guides the user through test procedures. Aural
prompts are also provided to indicate the validity of an
entry and device test results. These prompts allow even
inexperienced users to perform tests with confidence; an
important consideration in production situations where user
apprehension can lead to lowered productivity.
Other time-saving features include a "retest" key that
allows repetitive testing of similar ICs without re-keying
the IC number or family. Also, certain keys are of the
"soft" design, assuming different functions at appropriate
times. This design simplifies operation by reducing the
number of controls.
The model 560 is designed with tomorrow, as well as today,
in mind. Since the IC library is contained in EPROM
software, periodically-expanded IC Library EPROM ICs are
offered by B & K-Precision as new ICs are introduced. Your
unit can be updated to test the newest ICs by simply
replacing the library EPROMs.
An optional Software package is also available which allows
programming of custom devices not contained in the IC
Library via a personal computer and the tester's RS-232 port.
Advanced engineering, quality construction, and
user-oriented concepts and design make the model 560 an
exceptionally superior and effective instrument. To gain the
most effective use of this instrument, we recommend that you
study the entire contents of this manual.
Handleidingen type:
Gebruikershandleiding
Pagina’s:
55
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2.45 Mbytes (2570570 Bytes)
Taal:
english
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Upload datum:
2018 08 05
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51b0d18ec885ed00b8ec7a40cb465a6b
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440
Informatie
TEST INSTRUMENT SAFETY ... inside front cover
INTRODUCTION ... 1
FEATURES ... 2
SPECIFICATIONS ... 3
GLOSSARY OF TERMS ... 4
CONTROLS AND INDICATORS ... 5
GENERAL OPERATING INFORMATION ... 9
Safety Precautions ... 9
Equipment Protection Precautions ... 9
Correct Operating Practice ... 9
Tester Power-Up ... 9
Using IC Test Socket ... 10
Using In-Circuit Test Cable ... 10
Selecting IC Family/Type ... 11
Using Scan Keys ... 12
Test Result Prompts ... 12
Using Retest Key ... 13
Aural Prompts ... 13
TESTING MEMORY ICs ... 14
TIPS & HINTS TO HELP AVOID COMMON
MISTAKES ... 16
OUT-OF-CIRCUIT DEVICE TEST MODE ... 18
IN-CIRCUIT DEVICE TEST MODE ... 19
DEVICE COMPARE MODE ... 21
BOARD LEARN MODE ... 23
BOARD TEST MODE ... 28
MEMORY TRANSFER & CONTROL ... 30
Custom Program EEPROMs ... 30
EEPROM Compartment ... 31
Storing into EEPROM ... 31
Loading EEPROM-based Routine ... 32
Moving Contents
Between Two EEPROMs ... 33
Adding Routines To Previously-Written EEPROMs ... 33
USING RS-232 PORT ... 34
SPECIAL PROMPTS ... ... 36
MAINTENANCE ... 38
Fuse Replacement ... 38
Instrument Repair Service ... 38
Line Voltage Conversion ... 38
Cover Removal ... 39
Updating Library/System EPROMs ... 39
EPROM Replacement ... 41
Cover Replacement ... 41
APPENDIX 1 ... 42
How Conventional Functional
Tests Work ... 42
Why Conventional Testing Won't Work in
Many In-Circuit Applications ... 44
How the model 560 Compare & Learn Modes Test Hard-Wired
In-Circuit Devices ... 46
model 560 Limitations ... 48
APPENDIX H ... 50
Symbol Legend ... 50
OUT CKT Device Test Flowchart ... 51
IN CKT Device Test Flowchart ... 51
Device Compare Flowchart ... 52
Store Flowchart ... 53
Board Learn Flowchart ... 53
Board Test Flowchart ... 54
Load Flowchart ... 54
WARRANTY SERVICE INSTRUCTIONS ... 55
LIMITED ONE-YEAR WARRANTY ... 56
BOARD LEARN/TEST
LOG SHEET ... inside rear cover