Application Manual

Quick Reference Guide

SECTION 1 — Getting Started 1.1 INTRODUCTION ...1-1 Source-Measure Concepts 1.2 OPERATION OVERVIEW...1-3 1.3 BASIC CIRCUIT CONFIGURATIONS...1-7 1.4 GUARD AND REMOTE SENSING ...1-9 1.5 OPERATING BOUNDARIES ...1-9 Front and Rear Panel Familiarization 1.6 FRONT PANEL FAMILIARIZATION ...1-13 1.7 REAR PANEL FAMILIARIZATION...1-16 Basic Source-Measure Techniques 1.8 POWER UP...1-19 1.9 CONNECTIONS...I'20 1.9.1 Source Measure Unit Connections to Test Fixture ...1-20 1.9.2 Test Connections ...1-21 1.10 SOURCE-MEASURE EXAMPLES ...1-22 1.10.1 Dc Operation Example — Resistor Test...1-22 1.10.2 Sweep Operation Example — Zener Diode Test... 1-24 SECTION 2 — Operation 2.1 INTRODUCTION...2-1 2.2 POWER UP PROCEDURE...2-3 2.2.1 Line Voltage Setting...2-3 2.2.2 Fuse Replacement ...2-3 2.2.3 Power Cord...2-4 2.2.4 Power up Display Messages and Self Test...2-4 2.2.5 Power up Configuration...2-4 2.2.6 Line Frequency Setting...2-4 2.2.7 Warm Up Period ...2-5 2.2.8 Fan Filter Cleaning ...2-5 Connections 2.3 BASIC TEST CONNECTIONS ...2-7 2.3.1 Interlock ...2-7 2.3.2 Guarding, Shielding and Sensing ...2-8 2.3.3 Model 8006 Component Test Fixture ...2-10 2.3.4 Custom Test Fixture...2-12 2.4 MULTI UNIT CONNECTIONS...2-16 2.4.1 Interlock Connections...2-16 2.4.2 Trigger Connections ...2-17 2.4.3 Test Connections ...2-19 2.5 IEEE-488 BUS CONNECTIONS ...2-20 2.5.1 Bus Connector ...2"20 2.5.2 Multiple Connections ...2-20 2.5.3 Recommended Cables...2-20 2.5.4 Connection Procedure ... 2-20 2.5.5 Bus Limitations ... 2-20 2.6 TYPICAL SWITCHING CONFIGURATIONS ... 2-21 2.6.1 Model 7058 Low Current Switching Card... 2-21 2.6.2 Model 7152 Low Current Matrix Card... 2-24 2.6.3 Model 7072 Semiconductor Matrix Card... 2-28 2.6.4 General Purpose Matrix Cards ... 2-30 2.7 HIGH VOLTAGE SWITCHING CONFIGURATIONS ... 2-31 2.7.1 Model 7154 2-pole High Voltage Scanner Card ... 2-31 2.7.2 Model 7054 1-pole High Voltage Scanner Card ... 2-32 2.7.3 Model 7070-PCA Prototype Circuit Assembly ... 2-32 2.7.4 Model 7072 HV High Voltage Semiconductor Matrix Card... 2-32 Operating Fundamentals (Dc Operation) 2.8 DISPLAY MESSAGES... 2-33 2.9 DATA ENTRY ... 2-33 2.9.1 Entering Source and Compliance Values... 2-35 2.9.2 Entering Other Operating Parameters... 2-36 2.10 MENU... 2-36 2.10.1 Dc Delay... 2-37 2.10.2 Default Delay... 2-37 2.10.3 Sense ... 2-39 2.10.4 Ac Line Frequency... 2-40 2.10.5 IEEE-488 Bus Address... 2-41 2.10.6 Display Test ... 2-41 2.10.7 Memory Test... 2-41 2.10.8 Factory Initialization... 2-42 2.11 SELECT SOURCE AND FUNCTION ... 2-44 2.12 SET COMPLIANCE AND MEASUREMENT RANGE... 2-46 2.13 AUTORANGE... 2-48 2.14 OPERATE... 2-49 2.15 /TIME... 2-50 2.16 Filter 2-52 2.17 SUPPRESS ... 2-53 Sweep Operation 2.18 BASIC SWEEP WAVEFORMS... 2-55 2.19 CREATE SWEEP... 2-61 2.19.1 Parameter Definitions... 2-61 2.19.2 General Procedure... 2-62 2.19.3 IEEE-488 Bus Operation... 2-67 2.19.4 Fixed Level Sweep... 2-67 2.19.5 Linear Staircase Sweep... 2-68 2.19.6 Logarithmic Staircase Sweep... 2-70 2.19.7 Pulse Sweep... 2-71 2.19.8 Linear Staircase Pulse Sweep... 2-72 2.19.9 Log Staircase Pulse Sweep... 2-73 2.20 APPEND SWEEP ... 2-75 2.20.1 Sweep Append Procedure... 2-76 2.20.2 IEEE-488 Bus Operation... 2-77 2.21 MODIFY SWEEP... 2-78 2.21.1 Sweep Modification Procedure... 2-80 2.21.2 IEEE-488 Operation... 2-80 2.22 CONFIGURE TRIGGERS... 2-81 2.22.1 Input Triggers... 2-83 2.22.2 Input Trigger Origin ... 2.22.3 Output Triggers ... 2-88 2.22.4 Sweep End Output Trigger... 2-88 2.22.5 Enable/Disable Triggers... 2-88 2.22.6 Trigger Configuration Procedure ... 2-90 2.22.7 IEEE-488 Operation... 2-91 2.23 PERFORMING A SWEEP... 2-91 2.24 RECALLING SWEEP DATA... 2-92 2.25 MULTI UNIT OPERATION... 2-94 Source-Measure Considerations 2.26 CURRENT CLAMP... 2-99 2.27 SINK OPERATION... 2-101 2.28 MAKING STABLE MEASUREMENTS ... 2-105 2.29 MEASURE ONLY ... 2-110 2.30 GUARDING... 2-112 2.31 ELECTROSTATIC INTERFERENCE ... 2-113 2.32 THERMAL EMFS ... 2'113 2.33 ELECTROMAGNETIC INTERFERENCE (EMI) ... 2-114 2.34 GROUND LOOPS... 2‘114 SECTION 3 — IEEE-488 Reference 3.1 INTRODUCTION... 3-1 3.2 PRIMARY ADDRESS PROGRAMMING... 3-1 3.3 CONTROLLER PROGRAMMING... 3-2 3.4 FRONT PANEL ASPECTS OF IEEE-488 OPERATION... 3-2 3.4.1 Front Panel Messages ... 3-2 3.4.2 IEEE-488 Status Indicators... 3-5 3.4.3 LOCAL Key ... 3-5 3.5 GENERAL BUS COMMANDS... 3-5 3.5.1 REN (Remote Enable)... 3-6 3.5.2 IFC (Interface Clear) ... 3-6 3.5.3 LLO (Local Lockout)... 3-6 3.5.4 GTL (Go To Local) and Local... 3-6 3.5.5 DCL (Device Clear) ... 3-7 3.5.6 SDC (Selective Device Clear)... 3-7 3.5.7 GET (Group Execute Trigger)... 3-7 3.5.8 SPE, SPD (Serial Polling)... 3-7 Device-dependent Commands 3.6 DEVICE-DEPENDENT COMMAND PROGRAMMING... 3-11 3.6.1 A — Modify Sweep List ... 3-16 3.6.2 B —Bias... 349 3.6.3 C — Calibration... 3-22 3.6.4 D —Display... 3'25 3.6.5 F — Source and Function... 3-27 3.6.6 G — Output Data Format... 3-28 3.6.7 H — IEEE Immediate Trigger ... 3-35 3.6.8 J — Self-tests... 3-36 3.6.9 K —EOI and Bus Hold-Off ... 3-37 3.6.10 L — Compliance... 3"3 3.6.11 M — SRQ Mask and Serial Poll Byte Format... 3'40 3.6.12 N — Operate... 3'44 3.6.13 O — Output Sense... 3'4 3.6.14 P — Filter 3-46 3.6.15 Q — Create/Append Sweep List ...3-47 3.6.16 R — Trigger Control ...3-57 3.6.17 S — Integration Time ...3-58 3.6.18 T — Trigger Configuration...3-59 3.6.19 U — Status ...3-62 3.6.20 V — 1100V Range Control ...3-75 3.6.21 W — Default Delay...3-77 3.6.22 X — Execute...3-79 3.6.23 Y —Terminator...3-80 3.6.24 Z — Suppress...3-81 3.7 TIMING CONSIDERATIONS...3-82 3.7.1 Factors Affecting Sweep Times...3-83 3.7.2 Optimizing Source and Measurement Speed ...3-83 3.7.3 Estimating Sweep Performance...3-91 3.7.4 Estimating dc Performance ...3-92 APPENDICES A Device-dependent Command Summary...A-l B Interface Function Codes...B-l C ASCII Character Codes and IEEE-488 Multiline Interface Command Messages ...C-l D Controller Programs...D-l E IEEE-488 Bus Overview...E-l F 236/237 Performance Verification ...F'l