Informations sur l'appareil:
|Huntron Instruments HTR 1005B-1S Test Set|
The HUNTRON TRACKER® is a special type of CRT display and signal processing instrument that can be used to determine the quality of certain types of electronic components. Components are tested with a two terminal system of test leads that are placed across the component under test. The test leads are inserted into the TRACKER® front panel. The TRACKER® is used to test components in a power-off condition, and can be used to test components mounted on printed circuit boards or other in-circuit conditions even with components bridged by various types of resistive values. Devices that are normally tested by the TRACKER® include the following: semiconductor diodes, bipolar transistors, and field effect transistors; bipolar and MOS integrated circuits, including both analog and digital; certain types of capacitors and inductors. Included as standard equipment with each TRACKER® is a set of HUNTRON® MICRO PROBES™. The MICRO PROBE™ leads plug into the front panel test jacks. MICRO PROBES™ have special tips so that they can be used to contact very small component terminals and small PCB etchings without the danger of shorting adjacent terminals and leads. Also included as standard equipment is a common test lead which is used with the TRACKER® in the “Comparatrace” mode.
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|Huntron Instruments -- HTR 1005B-1S -- Service et Manuel de l'utilisateur|
|Type de document:||Service et Manuel de l'utilisateur|
|Nombre de pages:||38|
|Taille du fichier:||1.60 Mbytes (1681756 Bytes)|
|qualité:||Document scanné, la lecture en partie mal, en partie illisible.|
|Chargé sur:||11 mars 2014|
|Téléchargements:||665 depuis 11 mars 2014|
SPECIFICATIONS ... 2 GENERAL DESCRIPTION ... 3 THEORY OF OPERATION ... 5 The Test Signal ... 5 Testing Reactive Components ... 8 CIRCUIT DESCRIPTION Signal Section ... 10 Oscillator ... 12 Power Supply ... 12 Cathode Ray Tube Circuit ... 12 INTERNAL SETUP AND ADJUSTMENTS ... 17 TROUBLE SHOOTING General Information ... 19 Power Supply ... 19 Signal Section ... 22 CRT Section ... 24 Oscillator Section ... 24 LIST OF REPLACEMENT PARTS ... 25 SETUP, ADJUSTMENT & SCHEMATIC FOR SERIAL# PREFIX 212 ... 33
|Huntron Instruments -- HTR 1005B-1S -- Manuel de l'utilisateur|
|Type de document:||Manuel de l'utilisateur|
|Nombre de pages:||110|
|Taille du fichier:||2.18 Mbytes (2284632 Bytes)|
|qualité:||Document scanné, tous les lisible.|
|Chargé sur:||11 mars 2014|
|Téléchargements:||585 depuis 11 mars 2014|
This manual is provided for the operator of the Huntron Tracker. The information contained within this manual familiarizes the reader first with the tracker and its principles of operation, and then with its specific uses. A working knowledge of the tracker’s operating principles greatly assists the user in evaluating the tracker’s display, especially when using the instrument for troubleshooting purposes. The manual is divided into sections. Each section contains information pertinent to a certain application of the unit. The sections contain the following information. Section l - GENERAL INFORMATION This section provides a description of the tracker and lists its specifications. It also describes the principles on which the tracker operates, using a pure resistance and a diode as examples. Section 2 - TRACKER OPERATION This section describes the front panel controls of the tracker. It also describes the tracker’s comparative testing feature. Section 3 - DIODE TESTING This section describes the characteristics of the diode (showing its voltage-to-current relationship), which is essential to understanding the tracker display. This section also illustrates and describes tracker displays produced when the test leads are connected to (or across) circuits containing the following devices: silicon diodes, high voltage silicon diodes, zener diodes, bridging diodes, and light-emitting diodes. Section 4 - TRANSISTOR TESTING This section illustrates and describes tracker displays produced when the test leads are connected to (or across) circuits containing the following devices: NPN and PNP transistors, Darlington pairs, germanium transistors, MOSFET’s, J-FET’s, and unijunction transistors. Section 5 - PASSIVE COMPONENTS This section describes and illustrates tracker displays produced when the test leads are connected to capacitive, inductive, and resitive circuits or devices. Section 6 - TESTING MULTIPLE COMPONENT CIRCUITS This section covers the testing of diode/resistor combinations. diode/capacitor combinations, and capacitor/resistor combinations. Section 7 - TESTING INTEGRATED CIRCUITS This section discusses integrated circuit technology followed by testing information for linear devices such as operational amplifiers and voltage regulators. Testing information is also provided for the LM555 Timer as well as TTL. LS TTL, and CMOS devices. Section 8 - TESTING RECTIFIERS This section describes the testing of silicon-controlled rectifiers and TRIAC devices. Section 9 - TESTING POWER SUPPLIES This describes how to use the tracker to test the typical transformer/full-wave bridge type'power supply. Section 10 - TESTING COMPONENTS BY COMPARISON This section provides tracker displays for defective components as compared to known good devices. The tracker is used in the alternate mode to check a high voltage transistor, a high voltage diode, an electrolytic capacitor, an op-amp, and a regulator.
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