Fluke 9000A-8051 Interfaz
Manufacturer:
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Model:
9000A-8051
Date:
1984
Category:
Group:
Description:
Interface Pod
Information
PURPOSE OF Interface POD
The 9000A-8051 Interface Pod interfaces any 9000 Series
Micro System Troubleshooter to equipment using an 8051- or
8044-family microprocessor.
The Micro System Troubleshooter (referred to hereafter as
the Troubleshooter) is used to service printed circuit
boards, instruments and systems that use a microprocessor.
The 9000A-8051 Interface Pod (referred to as the Pod) adapts
the general purpose architecture of the Troubleshooter to a
specific architecture of the 8051 and 8044 microprocessor
families. The Pod adapts such microprocessor-specific
functions as pin layout, status/control functions, interrupt
handling, timing, and memory and I/O addressing.
Manual type:
Servicio y Manual del usuario
Pages:
42
Size:
1.75 Mbytes (1837934 Bytes)
Language:
english
Revision:
Manual-ID:
744698
Date:
1984 10 01
Quality:
Documento Scaned, todo legible.
Upload date:
2018 01 16
MD5:
d4130728f8c3598c85a6e49ad4a3db36
Downloads:
442
Information
1-1. PURPOSE OF Interface POD ... 1-1
1-2. DESCRIPTION OF POD
... 1-1
1-3. SPECIFICATIONS
... 1-3
1-4. COMPATIBLE MICROPROCESSORS ... 14
2 INSTALLATION AND SELF TEST
... 2-1
2-1. INTRODUCTION
... 2-1
2-2. INSTALLING A MICROPROCESSOR INTO THE POD ... 2-1
2-3. CONNECTING THE POD TO THE UUT ... 2-1
2-4. PERFORMING THE POD SELF TEST ... 2-3
2-5.
INITIALIZATION ... 2A
3 MICROPROCESSOR DATA
... 3-1
3-1. INTRODUCTION
... 3-1
3-2. MICROPROCESSOR SIGNALS ... 3-1
4 OPERATING CHARACTERISTICS
... 4-1
4-1. INTRODUCTION
... 4-1
4-2. STATUS/ CONTROL LINES
... 4-1
4-3.
Introduction ... 4-1
4-4. Status Line Bit Assignments
... 4-2
4-5. Control Line Bit
Assignments ... 4-3
4-6. FORCING AND INTERRUPT LINES ... 4-3
4-7. ADDRESS SPACE ASSIGNMENT ... 4-3
4-8.
Introduction ... 4-3
4-9. External Memory
... 4-4
4-10. Internal RAM, Registers, and Stack
... 4-4
4-11. Internal Program
ROM ... 4-5
4-12. Diagnostic Addresses
... 4-5
4-13. Quick-Looping Test Addresses
... 4-5
4-14. Quick ROM and RAM Test Addresses
... 4-7
4-15. Block Write and Verify Addresses
... 4-7
4-16. Special Addresses
... 4-7
4-17. QUICK-LOOPING READ AND WRITE FUNCTIONS ... 4-7
4-18. SPECIAL ADDRESSES
... 4-10
4-19. Sell Test Failure Code
... 4-10
4-20. Status and Error Reporting Group
... 4-10
4-25. Error Reporting Masks
... 4-12
4-29. Address and Data Errors
... 4-13
4-33. Bus Tests
... 4-13
4-38. Refresh Enable
... 4-14
4-39. Mode Switch Manipulation
... 4-14
4-42. Quick Memory Tests
... 4-14
4-45. Block Memory Tests
... 4-19
4-46. CHARACTERISTICS OF THE LEARN
OPERATION ... 4-21
~ 4-47. CHARACTERISTICS OF BUS TEST
... 4-21
4-48. RUN UUT Limitations
... 4-22
f £ 4-52. ACTIVE ALE SIGNAL
... 4-22
4-53. Probe SYNCHRONIZATION
MODES ... 4-22
& <: 4-54. MARGINAL UUT PROBLEMS
... . ... 4-55.
Introduction ... 4-23
4-56. UUT Operating Speed and Memory
Access ... 4-23
; ; I 4-57, UUT Noise
Levels ... 4-23
' 4-58. Bus Loading
... 4-23
I q) 4-59. Clock
Loading ... 4-23
4-60. POD DRIVE CAPABILITY
... 4-23
( 4-61, DRIVABILITY TESTING
... 4-23
4-62. I/O Ports
... 4-23
4-63. Special Function Registers
... 4-24
^ 1 4-64. UUT POWER DETECTION
... 4-24
L—4-65. CLOCK SOURCES, SETUPS, AND PROBLEMS
... 4-24
4-66. EFFECTS OF THE CONFIGURATION SWITCHES
... 4-24
4-67, Introduction
... 4-24
4-68. Switch i (Port
0) ... 4-25
4-74. Switch 2 (Port
2) ... 4-26
4-80. Switch 3 (P3.2)
... 4-26
4-82. Switch 4 (P3.3)
... 4-26
4-84. Switch 5 (P3.6/P3.7)
... 4-27
4-88. Switch 6 (UUT Connection)
... 4-27
4-91. Switch 7 (CLK Source)
... 4-27
4-93. Switch 8 (External
CLK) ... 4-27
5 THEORY OF
OPERATION ... 5-1
5-1. INTRODUCTION
... 5-1
5-2. GENERAL POD OPERATION
... 5-1
5-3. Processor Section
... 5-1
5-4. UUT Interface Section
... 5-4
5-5. Timing and Control Section
... 5-4
5-6. UUT Power
Sensing ... 5-5
5-7, DETAILED BLOCK DIAGRAM DESCRIPTION
... 5-5
5-8. Detailed Description of the Processor
Section ... 5-5
5-9. Detailed Description of the UUT Interface Section
... 5-9
5-10. Detailed Description of the Timing and Control Section
... 5-10
5-12. UUT Power
Sensing ... 5-10
5-13. Detailed Description of the Self Test Circuit
... 5-10
