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The 236, 237, and 238 Source-Measure Units (SMU) are fully programmable instruments, capable of sourcing and measuring voltage or current simulta- neously. These systems are really four instruments in one: Voltage Source, Current source, voltage mea- sure and current measure. QQZQ QZQQ QZZQ The 236 will source voltage from 100μV to 110V, and current from 100fA to 100mA. It can also measure voltage from 10μV to 110V and current from 10fA to 100mA. The 237 offers the same capabilities with a decade enhancement in Voltage Source and mea- sure (1100V). In this higher voltage range, current source and measure is 10mA maximum. The 238 offers a decade enhancement in Current source and measure (1A). In this higher current range, voltage source and measure is 15V maximum. The 236, 237, and 238 will measure very small cur- rents and voltages. With current sensitivity of 10fA, measurement capabilities are equal to those of an electrometer. Selectable integration and the filtering of multiple measurements enhances sensitivity for demanding applications. Both source voltages and source currents settle to specified accuracy in as little as 500μs. Programma- ble delay and fast, integrating measurement capa- bility can provide coordinated source-measure times of 1ms. Applications These instruments address a wide variety of appli- cations, including the characterization of semicon- ductor devices, and the measurement of leakage currents or resistivity. They are particularly useful as source and measuring instruments in automated test equipment (ATE). The 236, 237, and 238 provide simple, accurate mea- surements in semiconductor applications. Multiple units controlled with a personal computer make a powerful semiconductor parameter Analyzer. Non- standard tests are also performed efficiently be- cause of the unique versatility of these units. Two accessory semiconductor test fixtures maintain the signal integrity of the SMUs all the way to your device. The 8006 is a general purpose test fixture, and the 8007 is designed to accommodate either 24- or 48-pin devices. These test fixtures can be safety interlocked with the 236, 237, and 238 to prevent accidental shock. A Keithley Model 707A or 708A switching matrix and semiconductor switching cards may be used in conjunction with the 236, 237, and 238 for opti- mum performance in automated semiconductor measurement applications. Keithley SMUs are powerful tools for research and industrial test applications. The short set-up time and simplified programming are big advantages for tests that need to be up and running quickly. The overall versatility is ideal for constantly changing research use. The large dynamic range of source and measure capabilities permits accurate measurement of insu- lation resistance, leakage current, and dissipation factors. The high sensitivity of these units make them ideal for characterizing the electrical proper- ties of many materials.