Hameg HZ65-3 Probe
Manufacturer:
Model:
HZ65-3
Date:
Category:
Group:
Description:
Component Tester
Information
- Test of semiconductors - Test of discrete components - Rugged and compact In conjunction with an Oscilloscope, the component tester HZ65 can be used to test semiconductor components, resistors, capacitors and inductors not only out-of- circuit, but also often without desoldering them from circuit boards. Within certain limits, testing of integrated circuitry is also possible. Transistors can be plugged into two 3-point sockets; any combination of 2 contacts may be selected for testing. This simplifies testing of different internal transistor paths (base-emitter, emitter- collector, base-collector). Components with larger-diameter leads and ICs are connected to the 2 jacks on the side of the HZ65 using 2 test cables. The direction of current flow through the tested component or IC can be reversed. The HZ65 is particularly indi- spensable for repairs of electronic devices, providing good-bad information within seconds. This also allows quick comparison of the unit under test with a known good component or network.

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User Manual
Manual type:
User Manual
Pages:
10
Size:
193.88 Kbytes (198534 Bytes)
Language:
english, german
Revision:
Manual ID:
27-0065-0310
Date:
Quality:
Electronic document, no scan, very well readable.
Upload date:
22 December 2018
MD5:
a44c0ece05df0319944b162f8cdedb47
Downloads:
101

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