BK Precision 560 Test Set
Manufacturer:
Model:
560
Date:
Category:
Group:
Description:
Programmable IC Tester

Information

INTRODUCTION The B & K-Precision model 560 Programmable IC Tester allows personnel of varied skill levels to perform fast, uncomplicated, and versatile IC testing. The powerful microcomputer-based operating system of the model 560 allows efficiency in IC testing not previously possible with moderately-priced testers. The instrument tests over 90% of the most popular digital ICs (including many RAM and ROM ICs), due to an extensive internal library of IC test data. To set up IC tests, you merely enter the desired testing mode, the IC generic number, and press the TEST key. The tester automatically arranges IC pin-out and test voltage levels. The tester also has provisions for in-circuit IC testing. This is feasible via a special feature that applies current backdrive to the in-circuit IC's surrounding circuitry, allowing implementation of the tester truth table in most cases. In addition to standard IC tests, the instrument also tests ICs contained on board assemblies where inputs of a device may be tied to logic states. Compare testing allows testing where pins may be tied to Vcc or ground; a condition that would cause "good" ICs to test "defective" with standard testing. The tester records (stores) the unique response of a reference IC and its circuit, and then uses this response for testing similar untested ICs. This feature is offered in both single-device (Device Compare) and multiple-device (Board Learn) modes. Using the Board Learn mode allows you to record the responses of all digital ICs contained on a board in one continuous operation. This mode also allows user indexing of IC and board nomenclature, thereby maintaining a convenient record of board contents for future use. Direct, "no guesswork" IC test results are shown on the fluorescent alphanumeric display which reads "PASS", or "FAIL", showing which pin(s) tested defective. Using clear, informative directives (via the display and LED arrays), the tester guides the user through test procedures. Aural prompts are also provided to indicate the validity of an entry and device test results. These prompts allow even inexperienced users to perform tests with confidence; an important consideration in production situations where user apprehension can lead to lowered productivity. Other time-saving features include a "retest" key that allows repetitive testing of similar ICs without re-keying the IC number or family. Also, certain keys are of the "soft" design, assuming different functions at appropriate times. This design simplifies operation by reducing the number of controls. The model 560 is designed with tomorrow, as well as today, in mind. Since the IC library is contained in EPROM software, periodically-expanded IC Library EPROM ICs are offered by B & K-Precision as new ICs are introduced. Your unit can be updated to test the newest ICs by simply replacing the library EPROMs. An optional Software package is also available which allows programming of custom devices not contained in the IC Library via a personal computer and the tester's RS-232 port. Advanced engineering, quality construction, and user-oriented concepts and design make the model 560 an exceptionally superior and effective instrument. To gain the most effective use of this instrument, we recommend that you study the entire contents of this manual.

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User Manual
Manual type:
User Manual
Pages:
55
Size:
2.45 Mbytes (2570570 Bytes)
Language:
english
Revision:
Manual ID:
Date:
Quality:
Scanned document, all readable.
Upload date:
05 August 2018
MD5:
51b0d18ec885ed00b8ec7a40cb465a6b
Downloads:
377

Information

TEST INSTRUMENT SAFETY ... inside front cover INTRODUCTION ... 1 FEATURES ... 2 SPECIFICATIONS ... 3 GLOSSARY OF TERMS ... 4 CONTROLS AND INDICATORS ... 5 GENERAL OPERATING INFORMATION ... 9 Safety Precautions ... 9 Equipment Protection Precautions ... 9 Correct Operating Practice ... 9 Tester Power-Up ... 9 Using IC Test Socket ... 10 Using In-Circuit Test Cable ... 10 Selecting IC Family/Type ... 11 Using Scan Keys ... 12 Test Result Prompts ... 12 Using Retest Key ... 13 Aural Prompts ... 13 TESTING MEMORY ICs ... 14 TIPS & HINTS TO HELP AVOID COMMON MISTAKES ... 16 OUT-OF-CIRCUIT DEVICE TEST MODE ... 18 IN-CIRCUIT DEVICE TEST MODE ... 19 DEVICE COMPARE MODE ... 21 BOARD LEARN MODE ... 23 BOARD TEST MODE ... 28 MEMORY TRANSFER & CONTROL ... 30 Custom Program EEPROMs ... 30 EEPROM Compartment ... 31 Storing into EEPROM ... 31 Loading EEPROM-based Routine ... 32 Moving Contents Between Two EEPROMs ... 33 Adding Routines To Previously-Written EEPROMs ... 33 USING RS-232 PORT ... 34 SPECIAL PROMPTS ... ... 36 MAINTENANCE ... 38 Fuse Replacement ... 38 Instrument Repair Service ... 38 Line Voltage Conversion ... 38 Cover Removal ... 39 Updating Library/System EPROMs ... 39 EPROM Replacement ... 41 Cover Replacement ... 41 APPENDIX 1 ... 42 How Conventional Functional Tests Work ... 42 Why Conventional Testing Won't Work in Many In-Circuit Applications ... 44 How the model 560 Compare & Learn Modes Test Hard-Wired In-Circuit Devices ... 46 model 560 Limitations ... 48 APPENDIX H ... 50 Symbol Legend ... 50 OUT CKT Device Test Flowchart ... 51 IN CKT Device Test Flowchart ... 51 Device Compare Flowchart ... 52 Store Flowchart ... 53 Board Learn Flowchart ... 53 Board Test Flowchart ... 54 Load Flowchart ... 54 WARRANTY SERVICE INSTRUCTIONS ... 55 LIMITED ONE-YEAR WARRANTY ... 56 BOARD LEARN/TEST LOG SHEET ... inside rear cover

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