Hameg HZ65-3 Probe
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Model:
HZ65-3
Date:
Category:
Group:
Description:
Component Tester
Information
- Test of semiconductors
- Test of discrete components
- Rugged and compact
In conjunction with an Oscilloscope, the
component tester HZ65 can be used to test
semiconductor components, resistors,
capacitors and inductors not only out-of-
circuit, but also often without desoldering
them from circuit boards. Within certain
limits, testing of integrated circuitry is also
possible. Transistors can be plugged into
two 3-point sockets; any combination of 2
contacts may be selected for testing.
This simplifies testing of different internal
transistor paths (base-emitter, emitter-
collector, base-collector). Components with
larger-diameter leads and ICs are connected
to the 2 jacks on the side of the HZ65 using
2 test cables. The direction of current flow
through the tested component or IC can be
reversed. The HZ65 is particularly indi-
spensable for repairs of electronic devices,
providing good-bad information within
seconds. This also allows quick comparison
of the unit under test with a known good
component or network.
Manual type:
User Manual
Pages:
10
Size:
193.88 Kbytes (198534 Bytes)
Language:
english, german
Revision:
Manual ID:
27-0065-0310
Date:
Quality:
Electronic document, no scan, very well readable.
Upload date:
2018 12 22
MD5:
a44c0ece05df0319944b162f8cdedb47
Downloads:
701