Micronta 22-024 Test Set
Fabricante:
Modelo:
22-024
Data:
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Descrição:
Transistor Tester

Informação

Radio Shack’s new 'Micronta' Transistor Tester is capable of ckecking a wide range of transistor types, either “in circuit” or out of circuit. It has been specially designed to take advantage of the newest concept of dynamic testing under current Amplifier conditions. To use, simply plug the transistor to be checked into the front panel socket, or connect it with the alligator clip test leads provided. No preliminary set-up is needed The unit safely and automatically identifies low, medium and high-power PNP and NPN transistors. It provides a visual indication of signal output, giving positive information on the following tests simultaneously : (A) Electrode Open Circuits (B) Short Circuits (C) Current Gain The visuat indication of the output signal is the result of dynamic current gain in an actual operating circuit. Further leakage tests are unnecessary, as the dynamic distribution of leakage is taken into account in testing. The ’Micronta’ Transistor Tester also permits matching similar transistors in actual operating circuits, and provides a reliable GO/NO-GO test at practical collector currents (from 5 ma on small signal types to 50 ma and more on power types). Match similar type transistors by observing and comparing dial readings; the higher the reading, the higher the gain. To determine distributed leakage, note the firing point of the lamp. The brilliance of the neon lamp gives an indication of greater or lesser output. An adjustable base current control allows you to test transistors over a broad range of current conditions. If operation at increased current is desired, an additional load resistor may be inserted in the jacks. The use of an AC voltmeter or Oscilloscope as an output indicator will show a measurable output on collector currents as low as 5 ma. Jacks are provided for use with these instruments for: (1) providing amplitude signal output indications (2) making sensitive noise tests (3) studying dynamic leakage distribution (4) wave form inspection

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Manual do Usuário
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Scaned documento, todas legível.
Data de upload:
2017 04 18
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341da56120558c9a8d04edd0ab06e4df
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601