Keithley 238 Inny
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Model:
238
Data:
1989
Kategoria:
Grupa:
Opis:
High current Source Measure Units
Informacja
The 236, 237, and 238 Source-Measure Units (SMU)
are fully programmable instruments, capable of
sourcing and measuring voltage or current simulta-
neously. These systems are really four instruments
in one: Voltage Source, Current source, voltage mea-
sure and current measure.
QQZQ
QZQQ
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The 236 will source voltage from 100μV to 110V, and
current from 100fA to 100mA. It can also measure
voltage from 10μV to 110V and current from 10fA to
100mA. The 237 offers the same capabilities with a
decade enhancement in Voltage Source and mea-
sure (1100V). In this higher voltage range, current
source and measure is 10mA maximum. The 238
offers a decade enhancement in Current source and
measure (1A). In this higher current range, voltage
source and measure is 15V maximum.
The 236, 237, and 238 will measure very small cur-
rents and voltages. With current sensitivity of 10fA,
measurement capabilities are equal to those of an
electrometer. Selectable integration and the filtering
of multiple measurements enhances sensitivity for
demanding applications.
Both source voltages and source currents settle to
specified accuracy in as little as 500μs. Programma-
ble delay and fast, integrating measurement capa-
bility can provide coordinated source-measure
times of 1ms.
Applications
These instruments address a wide variety of appli-
cations, including the characterization of semicon-
ductor devices, and the measurement of leakage
currents or resistivity. They are particularly useful as
source and measuring instruments in automated
test equipment (ATE).
The 236, 237, and 238 provide simple, accurate mea-
surements in semiconductor applications. Multiple
units controlled with a personal computer make a
powerful semiconductor parameter Analyzer. Non-
standard tests are also performed efficiently be-
cause of the unique versatility of these units.
Two accessory semiconductor test fixtures maintain
the signal integrity of the SMUs all the way to your
device. The 8006 is a general purpose test fixture,
and the 8007 is designed to accommodate either 24-
or 48-pin devices. These test fixtures can be safety
interlocked with the 236, 237, and 238 to prevent
accidental shock.
A Keithley Model 707A or 708A switching matrix
and semiconductor switching cards may be used in
conjunction with the 236, 237, and 238 for opti-
mum performance in automated semiconductor
measurement applications.
Keithley SMUs are powerful tools for research and
industrial test applications. The short set-up time
and simplified programming are big advantages for
tests that need to be up and running quickly. The
overall versatility is ideal for constantly changing
research use.
The large dynamic range of source and measure
capabilities permits accurate measurement of insu-
lation resistance, leakage current, and dissipation
factors. The high sensitivity of these units make
them ideal for characterizing the electrical proper-
ties of many materials.
Typ ręczny:
Instrukcja obsługi
Strony:
314
Rozmiar:
13.15 Mbytes (13787760 Bytes)
Język:
english
Rewizja:
Fifth Printing
Ręczny ID:
236-901-01
Data:
Jakość:
Skanowany dokument, wszystko czytelne.
Data przesłania:
2012 05 20
MD5:
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Pobrane:
4337
Typ ręczny:
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Strony:
4
Rozmiar:
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Język:
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Rewizja:
Ręczny ID:
Data:
Jakość:
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Data przesłania:
2017 04 23
MD5:
6dbf6ec951ea96c08fb8664efbdfe620
Pobrane:
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Typ ręczny:
Instrukcja obsługi
Strony:
314
Rozmiar:
14.68 Mbytes (15390268 Bytes)
Język:
english
Rewizja:
E
Ręczny ID:
236-900-01 Rev. E
Data:
2001 03 01
Jakość:
Dokument elektroniczny, bez skanowania, bardzo dobrze czytelne.
Data przesłania:
2020 07 23
MD5:
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Pobrane:
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Informacja
SECTION 1 — Getting Started
1.1 INTRODUCTION ... 1-1
Source-Measure Concepts
1.2 OPERATION OVERVIEW ... 1-3
1.3 BASIC CIRCUIT CONFIGURATIONS ... 1-7
1.4 GUARD AND REMOTE SENSING ... 1-9
1.5 OPERATING BOUNDARIES ... 1-9
Front and Rear Panel Familiarization
1.6 FRONT PANEL FAMILIARIZATION ... 1-13
1.7 REAR PANEL FAMILIARIZATION ... 1-16
Basic Source-Measure Techniques
1.8 POWER UP ... 1-19
1.9 CONNECTIONS ... I'20
1.9.1 Source Measure Unit Connections to Test Fixture ... 1-20
1.9.2 Test Connections ... 1-21
1.10 SOURCE-MEASURE EXAMPLES ... 1-22
1.10.1 Dc Operation Example — Resistor Test ... 1-22
1.10.2 Sweep Operation Example — Zener Diode Test ... 1-24
SECTION 2 — Operation
2.1 INTRODUCTION ... 2-1
2.2 POWER UP PROCEDURE ... 2-3
2.2.1 Line Voltage Setting ... 2-3
2.2.2 Fuse Replacement ... 2-3
2.2.3 Power Cord ... 2-4
2.2.4 Power up Display Messages and Self Test ... 2-4
2.2.5 Power up Configuration ... 2-4
2.2.6 Line Frequency Setting ... 2-4
2.2.7 Warm Up Period ... 2-5
2.2.8 Fan Filter Cleaning ... 2-5
Connections
2.3 BASIC TEST CONNECTIONS ... 2-7
2.3.1 Interlock ... 2-7
2.3.2 Guarding, Shielding and Sensing ... 2-8
2.3.3 Model 8006 Component Test Fixture ... 2-10
2.3.4 Custom Test Fixture ... 2-12
2.4 MULTI UNIT CONNECTIONS ... 2-16
2.4.1 Interlock Connections ... 2-16
2.4.2 Trigger Connections ... 2-17
2.4.3 Test Connections ... 2-19
2.5 IEEE-488 BUS CONNECTIONS ... 2-20
2.5.1 Bus Connector ... 2"20
2.5.2 Multiple Connections ... 2-20
2.5.3 Recommended Cables ... 2-20
2.5.4 Connection Procedure ... 2-20
2.5.5 Bus Limitations ... 2-20
2.6 TYPICAL SWITCHING CONFIGURATIONS ... 2-21
2.6.1 Model 7058 Low Current Switching Card ... 2-21
2.6.2 Model 7152 Low Current Matrix Card ... 2-24
2.6.3 Model 7072 Semiconductor Matrix Card ... 2-28
2.6.4 General Purpose Matrix Cards ... 2-30
2.7 HIGH VOLTAGE SWITCHING CONFIGURATIONS ... 2-31
2.7.1 Model 7154 2-pole High Voltage Scanner Card ... 2-31
2.7.2 Model 7054 1-pole High Voltage Scanner Card ... 2-32
2.7.3 Model 7070-PCA Prototype Circuit Assembly ... 2-32
2.7.4 Model 7072-HV High Voltage Semiconductor Matrix Card ... 2-32
Operating Fundamentals (Dc Operation)
2.8 DISPLAY MESSAGES ... 2-33
2.9 DATA ENTRY ... 2-33
2.9.1 Entering Source and Compliance Values ... 2-35
2.9.2 Entering Other Operating Parameters ... 2-36
2.10 MENU ... 2-36
2.10.1 Dc Delay ... 2-37
2.10.2 Default Delay ... 2-37
2.10.3 Sense ... 2-39
2.10.4 Ac Line Frequency ... 2-40
2.10.5 IEEE-488 Bus Address ... 2-41
2.10.6 Display Test ... 2-41
2.10.7 Memory Test ... 2-41
2.10.8 Factory Initialization ... 2-42
2.11 SELECT SOURCE AND FUNCTION ... 2-44
2.12 SET COMPLIANCE AND MEASUREMENT RANGE ... 2-46
2.13 AUTORANGE ... 2-48
2.14 OPERATE ... 2-49
2.15 /TIME ... 2-50
2.16 FILTER ... 2-52
2.17 SUPPRESS ... 2-53
Sweep Operation
2.18 BASIC SWEEP WAVEFORMS ... 2-55
2.19 CREATE SWEEP ... 2-61
2.19.1 Parameter Definitions ... 2-61
2.19.2 General Procedure ... 2-62
2.19.3 IEEE-488 Bus Operation ... 2-67
2.19.4 Fixed Level Sweep ... 2-67
2.19.5 Linear Staircase Sweep ... 2-68
2.19.6 Logarithmic Staircase Sweep ... 2-70
2.19.7 Pulse Sweep ... 2-71
2.19.8 Linear Staircase Pulse Sweep ... 2-72
2.19.9 Log Staircase Pulse Sweep ... 2-73
2.20 APPEND SWEEP ... 2-75
2.20.1 Sweep Append Procedure ... 2-76
2.20.2 IEEE-488 Bus Operation ... 2-77
2.21 MODIFY SWEEP ... 2-78
2.21.1 Sweep Modification Procedure ... 2-80
2.21.2 IEEE-488 Operation ... 2-80
2.22 CONFIGURE TRIGGERS ... 2-81
2.22.1 Input Triggers ... 2-83
2.22.2 Input Trigger Origin ...
2.22.3 Output Triggers ... 2-88
2.22.4 Sweep End Output Trigger ... 2-88
2.22.5 Enable/Disable Triggers ... 2-88
2.22.6 Trigger Configuration Procedure ... 2-90
2.22.7 IEEE-488 Operation ... 2-91
2.23 PERFORMING A SWEEP ... 2-91
2.24 RECALLING SWEEP DATA ... 2-92
2.25 MULTI UNIT OPERATION ... 2-94
Source-Measure Considerations
2.26 CURRENT CLAMP ... 2-99
2.27 SINK OPERATION ... 2-101
2.28 MAKING STABLE MEASUREMENTS ... 2-105
2.29 MEASURE ONLY ... 2-110
2.30 GUARDING ... 2-112
2.31 ELECTROSTATIC INTERFERENCE ... 2-113
2.32 THERMAL EMFS ... 2'113
2.33 ELECTROMAGNETIC INTERFERENCE (EMI) ... 2-114
2.34 GROUND LOOPS ... 2‘114
SECTION 3 — IEEE-488 Reference
3.1 INTRODUCTION ... 3-1
3.2 PRIMARY ADDRESS PROGRAMMING ... 3-1
3.3 CONTROLLER PROGRAMMING ... 3-2
3.4 FRONT PANEL ASPECTS OF IEEE-488 OPERATION ... 3-2
3.4.1 Front Panel Messages ... 3-2
3.4.2 IEEE-488 Status Indicators ... 3-5
3.4.3 LOCAL Key ... 3-5
3.5 GENERAL BUS COMMANDS ... 3-5
3.5.1 REN (Remote Enable) ... 3-6
3.5.2 IFC (Interface Clear) ... 3-6
3.5.3 LLO (Local Lockout) ... 3-6
3.5.4 GTL (Go To Local) and Local ... 3-6
3.5.5 DCL (Device Clear) ... 3-7
3.5.6 SDC (Selective Device Clear) ... 3-7
3.5.7 GET (Group Execute Trigger) ... 3-7
3.5.8 SPE, SPD (Serial Polling) ... 3-7
Device-dependent Commands
3.6 DEVICE-DEPENDENT COMMAND PROGRAMMING ... 3-11
3.6.1 A — Modify Sweep List ... 3-16
3.6.2 B —Bias ... 349
3.6.3 C — Calibration ... 3-22
3.6.4 D —Display ... 3'25
3.6.5 F — Source and Function ... 3-27
3.6.6 G — Output Data Format ... 3-28
3.6.7 H — IEEE Immediate Trigger ... 3-35
3.6.8 J — Self-tests ... 3-36
3.6.9 K —EOI and Bus Hold-Off ... 3-37
3.6.10 L — Compliance ... 3"3
3.6.11 M — SRQ Mask and Serial Poll Byte Format ... 3'40
3.6.12 N — Operate ... 3'44
3.6.13 O — Output Sense ... 3'4
3.6.14 P — Filter ... 3-46
3.6.15 Q — Create/Append Sweep List ... 3-47
3.6.16 R — Trigger Control ... 3-57
3.6.17 S — Integration Time ... 3-58
3.6.18 T — Trigger Configuration ... 3-59
3.6.19 U — Status ... 3-62
3.6.20 V — 1100V Range Control ... 3-75
3.6.21 W — Default Delay ... 3-77
3.6.22 X — Execute ... 3-79
3.6.23 Y —Terminator ... 3-80
3.6.24 Z — Suppress ... 3-81
3.7 TIMING CONSIDERATIONS ... 3-82
3.7.1 Factors Affecting Sweep Times ... 3-83
3.7.2 Optimizing Source and Measurement Speed ... 3-83
3.7.3 Estimating Sweep Performance ... 3-91
3.7.4 Estimating dc Performance ... 3-92
APPENDICES
A Device-dependent Command Summary ... A-l
B Interface Function Codes ... B-l
C ASCII Character Codes and IEEE-488 Multiline Interface Command Messages ... C-l
D Controller Programs ... D-l
E IEEE-488 Bus Overview ... E-l
F 236/237 Performance Verification ... F'l
Typ ręczny:
Instrukcja obsługi
Strony:
89
Rozmiar:
1.12 Mbytes (1173854 Bytes)
Język:
english
Rewizja:
A
Ręczny ID:
236-905-01
Data:
1990 01 01
Jakość:
Skanowany dokument, wszystko czytelne.
Data przesłania:
2018 08 22
MD5:
a61e319c3e48c087249e9fb872b0091b
Pobrane:
1260
Informacja
Typ ręczny:
Instrukcja obsługi
Strony:
314
Rozmiar:
13.15 Mbytes (13788160 Bytes)
Język:
english
Rewizja:
E
Ręczny ID:
236-900-01
Data:
2001 03 01
Jakość:
Skanowany dokument, wszystko czytelne.
Data przesłania:
2018 08 22
MD5:
bad50a5f2100731e028e762654b77acd
Pobrane:
1847
Typ ręczny:
Dane techniczne
Strony:
2
Rozmiar:
913.00 Kbytes (934912 Bytes)
Język:
english
Rewizja:
Ręczny ID:
Data:
Jakość:
Dokument elektroniczny, bez skanowania, bardzo dobrze czytelne.
Data przesłania:
2014 03 07
MD5:
cc009c72023fcd05068ba4392cc81bc4
Pobrane:
1653
Typ ręczny:
Instrukcja serwisowa
Strony:
88
Rozmiar:
5.56 Mbytes (5827904 Bytes)
Język:
english
Rewizja:
Third printing
Ręczny ID:
238-902-01
Data:
Jakość:
Skanowany dokument, wszystko czytelne.
Data przesłania:
2012 05 20
MD5:
fd26245a170ff217f2671449ad8b071a
Pobrane:
971