|A.B.I. Electronics Rammaster Compact Other|
|Description||High speed Memory Tester|
The basic function of the RamMaster Compact is to perform a full speed functional test on DRAMs, SRAMs, SIMMs and SIPs using a variety of test algorithms to ensure reliable and rapid results. The test is performed by reconfigurable HARDWARE, allowing most memories to be tested at their theoretical full speed. Any malfunctioning memory cell results in a FAIL indication, and in the case of SIMM and SIP modules the faulty bit(s) is/are identified on the integral LCD display so that the module can be repaired. Additional facilities are also provided, amongst them test loops that can be used for goods inwards inspection or detecting intermittent faults. The supply voltage to the IC under test can be varied by ±5% during the test to simulate actual circuit conditions. Since the RamMaster Compact contains an extensive memory IC library, it is not necessary to programme the unit other than to select the IC part type. The unit is equipped with sockets covering the majority of Dual in Line (DIL), SIMM and SIP packages, and a range of adaptors are available for SOJ and ZIP packages and also for 72 pin PS/2 type SIMM modules. The RamMaster is capable of being upgraded and is designed to test the components of tomorrow.
These manuals are available for the above equipment:
|A.B.I. Electronics -- Rammaster Compact -- User Manual|
|Manual Type||User Manual|
|Size||5.34 Mbytes (5603237 Bytes)|
|Quality||Scanned document, all readable.|
|Upload date||16 March 2013|
|Downloads||297 since 16 March 2013|
DC INPUT 1 BATTERY ELIMINATOR 1 SWITCHING ON 2 USING THE MENUS 2 SELECTING THE MEMORY TO TEST 3 SELECTING THE TEST MODE 4 SELECTING THE TEST SPEED 4 INSERTING THE IC OR MODULE 5 TESTING THE IC OR MODULE 7 USING THE 72 PIN (PS2) SIMM ADAPTOR 8 USING THE ZIP ADAPTOR 9 USING THE SOJ ADAPTOR 9 USING CONFIG MODE 9 TEST ALGORITHM 9 SUMMARY OF TEST ALGORITHMS 11 TEST VCC VOLTAGE 11 AUTO POWER OFF 11 ERROR COUNT 11 SELF TEST MODE 12 SPECIFICATION
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