|Gould 400 Oscilloscope|
|Description||Digital Storage Oscilloscope|
Introduction This service manual is written primarily for the service engineer who is performing a standard recalibration or who is undertaking repairs when the instrument has developed a fault. The system overview will help the engineer to understand the inner workings of the 400 Digital storage oscilloscope (DSO). The fault finding procedure given in this manual takes a systematic approach. Starting with the symptoms, the engineer is led to the area or areas at fault by a series of questions in the form of several flowcharts. These require no knowledge of the system, although a basic knowledge of electronics is essential. Throughout this manual a reasonable level of understanding is assumed. A list of abbreviations and mnemonics used is shown in section 9. Many of the complex operational features of the 400 DSO are performed at chip level. The system includes one large semi-custom gate array which generates the ten phase system and related timings and handles the acquisition of data. On the analogue side there are three semi-custom analogue I.C.'s, two of which are channel preamplifiers providing virtually all the input signal processing, the third is the trigger signal processing circuit. When fault finding, they can be treated as 'Black Boxes' so alleviating some of the more difficult servicing tasks. Should a problem arise whilst servicing the instrument expert help and advice is available from Gould (see section 10 for details).
These manuals are available for the above equipment:
|Gould -- 400 -- Service Manual|
|Manual Type||Service Manual|
|Size||8.91 Mbytes (9339009 Bytes)|
|Quality||Scanned document, reading partly badly, partly not readable.|
|Upload date||11 March 2013|
|Downloads||779 since 11 March 2013|
Introduction 5 1. Safety and Power Requirements 6 1.1 International Safety Warning 5 1.2 Grounding 6 1.3 Live Parts 6 1.4 Ventilation and Dust 6 1.5 Operating Temperatures 6 1.6 Power and Frequency Requirements 6 1.7 Fuse Requirements 6 2. Specification 7 3. System Overview 10 3.1 From the BNC to the Screen 10 3.2 Microprocessor Control 10 3.3 Triggering 10 3.4 Timebase Generation 11 3.5 CCD 11 4. Calibration and Test 18 4.1 Calibration Schedule 18 4.2 The Test Menus 20 4.3 Noise Debug 20 4.4 CH1 Calibration Status 20 4.5 Test Cal Hardware 20 4.6 ETS Setup 20 4.7 ETS Debug Mode 21 4.8 Initialise Cal Stores 21 4.9 RS423 Test Interface 21 5. Servicing 22 5.1 How to use this section 22 5.2 Symptom tables 22 5.3 Fault finding flowcharts 24 5.4 Circuit descriptions 35 6. Circuit diagrams, parts lists and component location 47 7. Mechanical components and exploded views 79 8. Summary of in-circuit measurements 83 9. Definition of Mnemonics 85
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