|Huntron Instruments HTR 1005B Test Set|
The tracker is a genera! purpose troubleshooting test instrument. It qualitatively evaluates digital, analog, and hybrid semiconductor devices, as well as capacitive and inductive devices, in or out of circuit, in a power off state. The tracker operates by providing an ac stimulus to the component or circuit under test and displaying the resultant current and voltage levels and their phase relationship. The tracker display indicates any component leakage, shorts, opens, noise, pi us any combination of these problems. Included with each tracker is a set of Huntron Micro Probe test leads. These test leads plug into the front panel test jacks of the tracker and have special tips that allow contact with very small component terminals and printed circuit board traces without the danger of touching adjacent component leads and terminals. Also included with the tracker is a special common test lead that allows the connection of tracker common to two components. This test lead is used in the alternate mode of operation.
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|Huntron Instruments -- HTR 1005B -- Bedienungsanleitung|
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|Upload Datum:||02 August 2015|
|Downloads:||102 seit dem 02 August 2015|
This manual is provided for the operator of the Huntron Tracker. The information contained within this manual familiarizes the reader first with the tracker and its principles of operation, and then with its specific uses. A working knowledge of the tracker's operating principles greatly assists the user in evaluating the tracker's display, especially when using the instrument tor troubleshooting purposes. The manual is divided into sections. Each section contains information pertinent to a certain application of the unit. GENERAL INFORMATION This section provides a description of the tracker and lists its specifications. It also describes the principles on which the tracker operates, using a pure resistance and a diode as examples. Section 2 TRACKER OPERATION This section describes the front panel controls of the tracker. It also describes the tracker's comparative testing feature. Section 3 DIODE TESTING This section describes the characteristics of the diode (showing its voltage-to-current relationship), which is essential to understanding the tracker display. This section also illustrates and describes tracker displays produced when the lest leads are connected to (or across) circuits containing the following devices: silicon diodes, high voltage silicon diodes, zener diodes, bridging diodes, and light-emitting diodes. Section 4 - TRANSISTOR TESTING This section illustrates and describes tracker displays produced when the test leads are connected to (or across) circuits containing the following devices: NPN and PNP transistors. Darlington pairs, germanium transistors. MOSFET's. FEET's. and unijunction transistors. Section 5 - PASSIVE COMPONENTS This section describes and illustrates tracker displays produced when the test leads arc connected to capacitive, inductive, and resitive circuits or devices. Section 6 - TESTING MULTIPLE COMPONENT CIRCUITS This section covers the testing of diode/resistor combinations. diode/capacitor combinations, and capacitor-/resistor combinations. Section 7 TESTING INTEGRATED CIRCUITS Tins section discusses integrated circuit technology followed by testing information for linear devices such as operational amplifiers and voltage regulators. Testing information is also provided for the LM555 Timer as well as TTL, LS TTL. and CMOS devices. Section 8 - TESTING RECTIFIERS This section describes the testing of silicon-controlled rectifiers and TRIAC devices. Section 9 TESTING POWER SUPPLIES This describes how to use the tracker to test the typical transformer/full-wave bridge type‘power supply.
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