This manual is provided for the operator of the Huntron
Tracker. The information contained within this manual
familiarizes the reader first with the tracker and its
principles of operation, and then with its specific uses. A
working knowledge of the tracker's operating principles
greatly assists the user in evaluating the tracker's
display, especially when using the instrument tor
The manual is divided into sections. Each section contains
information pertinent to a certain application of the unit.
This section provides a description of the tracker and lists
its specifications. It also describes the principles on
which the tracker operates, using a pure resistance and a
diode as examples.
Section 2 TRACKER OPERATION
This section describes the front panel controls of the
tracker. It also describes the tracker's comparative testing
Section 3 DIODE TESTING
This section describes the characteristics of the diode
(showing its voltage-to-current relationship), which is
essential to understanding the tracker display. This section
also illustrates and describes tracker displays produced
when the lest leads are connected to (or across) circuits
containing the following devices: silicon diodes, high
voltage silicon diodes, zener diodes, bridging diodes, and
Section 4 - TRANSISTOR TESTING
This section illustrates and describes tracker displays
produced when the test leads are connected to (or
across) circuits containing the following devices: NPN and
PNP transistors. Darlington pairs, germanium transistors.
MOSFET's. FEET's. and unijunction transistors.
Section 5 - PASSIVE COMPONENTS
This section describes and illustrates tracker displays
produced when the test leads arc connected to capacitive,
inductive, and resitive circuits or devices.
Section 6 - TESTING MULTIPLE COMPONENT CIRCUITS
This section covers the testing of diode/resistor
combinations. diode/capacitor combinations, and
Section 7 TESTING INTEGRATED CIRCUITS
Tins section discusses integrated circuit technology
followed by testing information for linear devices such as
operational amplifiers and voltage regulators. Testing
information is also provided for the LM555 Timer as well as
TTL, LS TTL. and CMOS devices.
Section 8 - TESTING RECTIFIERS
This section describes the testing of silicon-controlled
rectifiers and TRIAC devices.
Section 9 TESTING POWER SUPPLIES
This describes how to use the tracker to test the typical
transformer/full-wave bridge type‘power supply.